3C-SiC Heteroepitaxial Layers Grown on Silicon Substrates with Various Orientations
نویسندگان
چکیده
This work investigates the 3C-SiC heteroepitaxial growth on silicon substrates having a wide variety of orientations, i.e. (100) axis and 2°off, (111), (110), (211), (311), (331), (510), (553) (995). All layers were grown using same two-step CVD process with rate 2 μm/h. According to X-ray diffraction characterizations, direct heteroepitaxy (layer exactly orientation as substrate) was successful most Si except for (110) one which only leading obvious polycrystalline deposit. Each layer led specific surface morphology, smoothest being ones (100)2°off, (995) substrates. None these cracked upon cooling though those (211) highly bowed.
منابع مشابه
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ژورنال
عنوان ژورنال: Materials Science Forum
سال: 2022
ISSN: ['1422-6375', '0250-9776', '0255-5476', '1662-9752', '1662-9760']
DOI: https://doi.org/10.4028/p-aaf11g